Hong Kong Conference Nets Best Paper Award for Engineering Faculty, Grad Student

Photo Submitted

From left: Fuqiang Sun of Beihang University, Industrial Engineering Department Head Ed Pohl, graduate student Cesar Ruiz, professor Haitao Liao and Way Kuo, president of City University Hong Kong.

Industrial Engineering faculty members and a doctoral student were recognized in Hong Kong last month at the 2019 International Conference on Mathematical Modeling in Reliability. The conference, held June 3-7, brought together leading international experts from the fields of mathematical theory, reliability and risk management.

University of Arkansas doctoral student Cesar Ruiz and professors Haitao Liao and Ed Pohl, along with Fuqiang Sun of Beihang University, received a "Best Paper" award for their paper, "Reliability Estimation from Multiple Degradation Processes with Dependent Random Effects." The paper proposed a new mathematical model for analyzing data widely seen in the areas of microelectronics and advanced manufacturing.

The proposed approach provides experts with a new statistical tool for component reliability prediction involving dependent degradation processes. With that tool, researchers and companies that use microelectronics and advanced manufacturing equipment will be better able to predict when different parts of their systems might fail.

The IMMR conferences serve as a forum for presenting the latest advances of research in the mathematical theory of reliability and risk management, including stochastic modeling, statistical inference, optimization, and decision support, as well as their applications, such as aging, maintenance, degradation, prognostic and health management, monitoring, and warranty and lifetime data analysis.

Its objective is to bring together the best international experts in the field from both academia and various industrial sectors such as energy, aeronautics, automotive and telecommunication. As a major international forum on reliability, it attracts researchers from around the world.